CONTACT SCANNING NEAR-FIELD OPTICAL MICROSCOPY

Citation
Da. Lapshin et al., CONTACT SCANNING NEAR-FIELD OPTICAL MICROSCOPY, JETP letters, 67(4), 1998, pp. 263-268
Citations number
10
Categorie Soggetti
Physics
Journal title
ISSN journal
00213640
Volume
67
Issue
4
Year of publication
1998
Pages
263 - 268
Database
ISI
SICI code
0021-3640(1998)67:4<263:CSNOM>2.0.ZU;2-W
Abstract
A new method of scanning in near-field optical microscopy, which makes it possible to operate in contact with the experimental sample, is pr oposed and implemented. This method permits the practical utilization of the idea of using the dipole-dipole resonance transfer of excitatio n energy from the active element of the microscope to the sample for a chieving a fundamental improvement in the resolution of near-field opt ical microscopy. (C) 1998 American Institute of Physics.