OHMIC CONTACTS FOR COMPOUND SEMICONDUCTORS

Citation
M. Murakami et Y. Koide, OHMIC CONTACTS FOR COMPOUND SEMICONDUCTORS, Critical reviews in solid state and materials sciences, 23(1), 1998, pp. 1-60
Citations number
102
Categorie Soggetti
Physics, Condensed Matter","Material Science
ISSN journal
10408436
Volume
23
Issue
1
Year of publication
1998
Pages
1 - 60
Database
ISI
SICI code
1040-8436(1998)23:1<1:OCFCS>2.0.ZU;2-C
Abstract
Although there has been strong demand for low -resistance, highly reli able Ohmic contacts for compound semiconductors to realize high-freque ncy transistors, high-power devices, and light-emitting (LED) and lase r diodes (LD), development of the Ohmic contact technologies has been made on a trial-and-error basis. The primary reason is lack of fundame ntal data to design ideal metal/semiconductor interfaces due to comple xity of elements involved at the interfacial reaction. In this article , we review recent systematic studies carried out for Ohmic contact ma terials to n-GaAs and then address critical issues to apply the method ology established in nGaAs to develop low-resistance Ohmic contacts fo r p-ZnSe and p-GaN, which are desperate for blue-green LED and LD.