A. Bek et A. Aydinli, TEMPERATURE-DEPENDENCE OF ABSORPTION-EDGE IN P-TYPE POROUS SILICON, PHYSICS OF LOW-DIMENSIONAL STRUCTURES, 1-2, 1998, pp. 223-229
The observed blue shift of both the PL and the absorption edge in poro
us silicon is generally understood within the framework of quantum con
finement of carriers in small crystallites where reduction of the dens
ity of states in the vicinity of c-Si band edge as well as increased o
scillator strength, lead to higher direct radiation rates. Temperature
dependence of transitions in semiconductors may provide additional in
formation to clarify the nature of the recombination mechanism in poro
us silicon. In this work, we have studied the temperature dependence o
f the absorption edge of free standing porous films in the photon rang
e of 3.1-1.35 eV and in the temperature range of 8.5-300 K. We find a
smoothly varying spectral dependence of transmission on photon energy
without any sharp features down to 8.5 K. The absorption edge for all
samples studied show a gradual blue shift with decreasing temperature.
Comparison with c-Si shows that red luminescing porous Si preserves t
he indirect nature of the c-Si band gap.