LOCAL DETERMINATION OF THE STACKING-SEQUENCE OF LAYERED MATERIALS

Citation
J. Fompeyrine et al., LOCAL DETERMINATION OF THE STACKING-SEQUENCE OF LAYERED MATERIALS, Applied physics letters, 72(14), 1998, pp. 1697-1699
Citations number
39
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
72
Issue
14
Year of publication
1998
Pages
1697 - 1699
Database
ISI
SICI code
0003-6951(1998)72:14<1697:LDOTSO>2.0.ZU;2-7
Abstract
The ability to modify the stacking sequence of ultrathin films offers a unique way to change either the interaction strength or the doping, but demands a careful control of each atomic monolayer. Progress is ha mpered by the lack of a direct method that allows differentiation on a local scale between the various terminating layers of a crystal. Here , the combination of a vacuum annealing process and friction force mic roscopy reveals this local distinction on a SrTiO3 surface. Using the friction contrast, we find how the terminating layer of a single cryst al profoundly influences the terrace edge structure. (C) 1998 American Institute of Physics. [S0003-6951(98)01914-7].