By using a back-gate operation, a high-quality two-dimensional electro
n gas (2DEG) is formed in an undoped GaAs/AlGaAs inverted heterostruct
ure. A high mobility of around 3 x 10(6) cm(2)/V s at 1.6 K is obtaine
d for the structure without any compensating surface doping. The elect
ron density is controllable down to 7 x 10(9) cm(-2). The relation bet
ween electron density and mobility is studied for samples both with an
d without a surface gate. The obtained results indicate that backgroun
d impurities and an inhomogeneity of the electric field coming from th
e surface govern the mobility in a low-electron-density region and tha
t the interface inhomogeneity becomes important at a high electron den
sity. (C) 1998 American Institute of Physics. [S0003-6951(98)02214-1].