MAGNETISM AND ITS DEPENDENCE ON ANNEALING TEMPERATURE FOR SPUTTERED CO CU MULTILAYER/

Citation
Rw. Gao et al., MAGNETISM AND ITS DEPENDENCE ON ANNEALING TEMPERATURE FOR SPUTTERED CO CU MULTILAYER/, JOURNAL OF MATERIALS SCIENCE & TECHNOLOGY, 14(2), 1998, pp. 139-142
Citations number
13
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
ISSN journal
10050302
Volume
14
Issue
2
Year of publication
1998
Pages
139 - 142
Database
ISI
SICI code
1005-0302(1998)14:2<139:MAIDOA>2.0.ZU;2-E
Abstract
Magnetism and its dependence on annealing temperature for r.f. sputter ed Co/Cu multilayers have been investigated. It was found that the eas y magnetization axes of the films are parallel to the substrate and th e magnetic properties of both as-sputtered and annealed multilayers ar e isotropic in the film plane. The coercive field H-c is 4.8 kA/m and the ratio of remanence-to-saturation magnetization M-Gamma/M-s is abou t 0.73 for as-sputtered samples. Both H-c and M-Gamma/M-s increase wit h increasing annealing temperatures, especially when annealing tempera tures are higher than 400 degrees C. These experimental results can be interpreted using the ferromagnetic exchange coupling and the pinning theory of the coercivity.