SI-ULSI WITH A SCALED-DOWN FUTURE

Authors
VASUDEV PK ZEITZOFF PM
Citation
Pk. Vasudev et Pm. Zeitzoff, SI-ULSI WITH A SCALED-DOWN FUTURE, IEEE circuits and devices magazine, 14(2), 1998, pp. 19-29
Citations number
23
Categorie Soggetti
Instument & Instrumentation","Engineering, Eletrical & Electronic
Journal title
IEEE circuits and devices magazine → ACNP
ISSN journal
87553996
Volume
14
Issue
2
Year of publication
1998
Pages
19 - 29
Database
ISI
SICI code
8755-3996(1998)14:2<19:SWASF>2.0.ZU;2-G