ON THE GROUND ELECTRONIC STATES OF COPPER SILICIDE AND ITS IONS

Citation
Ai. Boldyrev et al., ON THE GROUND ELECTRONIC STATES OF COPPER SILICIDE AND ITS IONS, The Journal of chemical physics, 108(14), 1998, pp. 5728-5732
Citations number
29
Categorie Soggetti
Physics, Atomic, Molecular & Chemical
ISSN journal
00219606
Volume
108
Issue
14
Year of publication
1998
Pages
5728 - 5732
Database
ISI
SICI code
0021-9606(1998)108:14<5728:OTGESO>2.0.ZU;2-9
Abstract
The low-lying electronic states of SiCu, SiCu+, and SiCu- have been st udied using a variety of high-level ab initio techniques. As expected on the basis of simple orbital occupancy and bond forming for Si(s(2)p (2))+Cu(S-1) species, (2) Pi(r), (1) Sigma(+), and (3) Sigma(-) states were found to be the ground electronic states for SiCu, SiCu+, and Si Cu-, respectively; the (2) Pi, State is not that suggested in most rec ent experimental studies. All of these molecules were found to be quit e strongly bound although the bond lengths, bond energies, and harmoni c frequencies vary slightly among them, as a result of the nonbonding character of the 2 pi-MO (molecular orbital) [composed almost entirely of the Si 3p-AO (atomic orbital)], the occupation of which varies fro m 0 to 2 within the (1) Sigma(+), (2) Pi(r), and (3) Sigma(-) series. The neutral SiCu is found to have bound excited electronic states of 4 Sigma(-), (2) Delta, (2) Sigma(+), and (2) Pi, symmetry lying 0.5, 1. 2, 1.8, and 3.2 eV above the (2) Pi(r). ground state. It is possible b ut not yet certain that the 2 Pi(i) state is, in fact, the ''B state'' observed in the recent experimental studies by Scherer, Paul, Collier , and Saykally. (C) 1998 American Institute of Physics.