ANNEALING-INDUCED MICROFACETING OF THE COO(100) SURFACE INVESTIGATED BY LEED AND STM

Authors
WEICHEL S MOLLER PJ
Citation
S. Weichel et Pj. Moller, ANNEALING-INDUCED MICROFACETING OF THE COO(100) SURFACE INVESTIGATED BY LEED AND STM, Surface science, 399(2-3), 1998, pp. 219-224
Citations number
19
Categorie Soggetti
Chemistry Physical
Journal title
Surface science → ACNP
ISSN journal
00396028
Volume
399
Issue
2-3
Year of publication
1998
Pages
219 - 224
Database
ISI
SICI code
0039-6028(1998)399:2-3<219:AMOTCS>2.0.ZU;2-2
Abstract
During a LEED examination of the CoO(100) surface a number of extra sp ots were observed in the LEED pattern. These spots indicated the prese nce of a faceting of the surface, and appeared upon annealing to 1100 K. Further analysis of the extra spots indicates that the faces of the structures formed are the CoO(110) planes. An STM study of the recons truction revealed it to consist of pyramidal surface depressions of si zes up to 500 Angstrom by 500 Angstrom. (C) 1998 Elsevier Science B.V.