IMPORTANCE OF LOCAL PATTERN PROPERTIES IN SPIRAL DEFECT CHAOS

Citation
Da. Egolf et al., IMPORTANCE OF LOCAL PATTERN PROPERTIES IN SPIRAL DEFECT CHAOS, Physical review letters, 80(15), 1998, pp. 3228-3231
Citations number
26
Categorie Soggetti
Physics
Journal title
ISSN journal
00319007
Volume
80
Issue
15
Year of publication
1998
Pages
3228 - 3231
Database
ISI
SICI code
0031-9007(1998)80:15<3228:IOLPPI>2.0.ZU;2-2
Abstract
analyze experimental data from Rayleigh-Benard convection in a large a spect ratio cell using a new, efficient method applicable to disordere d striped patterns from biological, chemical, optical, and fluid syste ms. We present statistics of various local pattern properties such as the local wave-vector magnitude, local pattern orientation, and defect densities. Using these statistics, we provide quantitative evidence d emonstrating that the stability boundaries derived for infinite system s are applicable to local patches within disordered patterns. We also present the first experimental observation of multiple length scales w ithin spiral defect chaos.