OXIDATION FILM SCALES AND FOURIER TRANSFO RMED INFRARED (FTIR) REFLECTANCE SPECTROSCOPY

It is shown how infrared spectroscopy can be used in reflection during the study of oxidation products. It alleviates the weaknesses of X-ra y diffraction during the analytical study of products in amorphous for m. It makes it possible to reach the thickness of the layers without d estroying them and with no special preparation. The organization of ox idation products can be obtained by comparison of experimental spectra with spectra calculated on the basis of the structures of the modelle d layers. Examples relating to the thermal oxidation of various grades such as X8Crl7, X8CrSil7, X8CrAlTil7 and Ni-Cr80/20 are treated in th is article.