SURFACE-MORPHOLOGY AND SURFACE P-CHANNEL FIELD-EFFECT TRANSISTOR ON THE HETEROEPITAXIAL DIAMOND DEPOSITED ON INCLINED BETA-SIC(001) SURFACES

Citation
H. Kawarada et al., SURFACE-MORPHOLOGY AND SURFACE P-CHANNEL FIELD-EFFECT TRANSISTOR ON THE HETEROEPITAXIAL DIAMOND DEPOSITED ON INCLINED BETA-SIC(001) SURFACES, Applied physics letters, 72(15), 1998, pp. 1878-1880
Citations number
20
Categorie Soggetti
Physics, Applied
Journal title
ISSN journal
00036951
Volume
72
Issue
15
Year of publication
1998
Pages
1878 - 1880
Database
ISI
SICI code
0003-6951(1998)72:15<1878:SASPFT>2.0.ZU;2-F
Abstract
The effect of an inclined substrate on heteroepitaxial diamond has bee n investigated on 4 degrees off beta-SiC(001) tilted around the [<(1)o ver bar10>] axis. Homogeneous macro steps with (001) terraces are obse rved in the [<(1)over bar10>] direction forming, a vicinal angle of 3 degrees-4 degrees from the (001) surface reflecting the substrate incl ination. The selective growth is effective even if the dominant orient ation is inclined by several degrees from the surface normal, The tilt deviation is less than 1 degrees in the heteroepitaxial film. p-chann el field effect transistors have been fabricated on these heteroepitax ial films. The device performance is as good as that on homoepitaxial films. (C) 1998 American Institute of Physics.