D. Dimovamalinovska et al., OPTICAL AND ELECTRICAL-PROPERTIES OF RF MAGNETRON-SPUTTERED ZNO-AL THIN-FILMS, Materials science & engineering. B, Solid-state materials for advanced technology, 52(1), 1998, pp. 59-62
Optical and electrical properties of Al-doped ZnO films, deposited by
R.F. magnetron sputtering, have been investigated as a function of pre
paration conditions in an attempt to develop transparent films with lo
w electrical resistivity. The electrical resistivity as well as the Ha
ll mobility of sputtered films depend on the R.F. power density and th
ickness of the films when it is less than about 300 nm. The free carri
er concentration is almost independent on the film thickness and the R
.F. power. The optical transmission of the films in the visible range
does nor depend on the thickness as well as on the R.F. power and is a
bout 90% from the substrate transmission there. In the near-infrared,
where the absorption is due to free carriers, the transmission depends
strongly on the film thickness and on the preparation conditions. (C)
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