ELECTRON-BEAM-INDUCED VOLTAGE CONTRAST AND MODULATED OPTICAL REFLECTANCE STUDIES OF YBCO THIN-FILM RESONATORS

Citation
Sal. Foulds et al., ELECTRON-BEAM-INDUCED VOLTAGE CONTRAST AND MODULATED OPTICAL REFLECTANCE STUDIES OF YBCO THIN-FILM RESONATORS, Superconductor science and technology, 11(4), 1998, pp. 378-382
Citations number
11
Categorie Soggetti
Physics, Applied","Physics, Condensed Matter
ISSN journal
09532048
Volume
11
Issue
4
Year of publication
1998
Pages
378 - 382
Database
ISI
SICI code
0953-2048(1998)11:4<378:EVCAMO>2.0.ZU;2-O
Abstract
Electron-beam-induced voltage contrast (EBIV) and modulated optical re flectivity (MOR) have been used to study the electrical properties of superconducting microwave resonators. The three resonators studied wer e patterned YBa2Cu3O7-x (YBCO) films on MgO substrates. The YBCO films consisted of a 200 mu m wide central track of 8 mm length separated f rom the ground plane by 80 mu m. A qualitative correlation was observe d between the EBIV and MOR signals observed throughout the central tra ck of the resonator. The EBIV results were taken close to the supercon ducting transition while the MOR data were obtained at room temperatur e. Both techniques are dependent on the local electrical properties wh ich in turn are governed to a large extent by the local oxygen content within the superconductor. The correlation between the MOR technique and the more established EBIV technique has shown MOR to be a useful i nspection tool for superconducting devices, particularly as MOR is a c ontactless room-temperature technique.