SIMS and XPS were used to characterise the chemistry of thin plasma po
lymerised acrylic acid films (ppAAc), and to determine how this was in
fluenced by plasma power. Quartz microbalance weight measurements were
used to monitor the effect of power on the deposition rate and identi
fy the uptake of water vapour by the films upon exposure to the atmosp
here. Functional group derivatisation and XPS were used to quantify th
e proportion of carboxylic acid and ester functionalities. Derivatisat
ion revealed that the level of retention in the deposit could be contr
olled by the plasma deposition power (P) up to a maximum of 66% at P =
2 W. TOF SIMS analysis identified the presence of linear structures w
ith up to five monomer units in the high retention deposit. The role o
f such structures in functional retention is discussed with reference
to mass spectrometry data in the literature.