STUDIES ON THE ELECTRICAL-CONDUCTIVITY, OPTICAL-ABSORPTION AND X-RAY-DIFFRACTION IN BISMUTH THIN-FILM

Spectroscopically pure bismuth is evaporated onto glass substrates at different substrate temperature using a Hind Hivac coating plant. The electrical conductivity of bismuth thin films, prepared at different s ubstrate temperatures is measured and thermal activation energy is eva luated. From the recorded optical absorption spectrum in the ultraviol et and visible regions optical band gap E-g is determined. X-ray diffr actograms are recorded and lattice parameters are determined.