ANALYSIS OF RESISTANCE AND INTERNAL REACTANCE IN SYSTEMS OF PARALLEL CONDUCTORS

Citation
J. Guo et al., ANALYSIS OF RESISTANCE AND INTERNAL REACTANCE IN SYSTEMS OF PARALLEL CONDUCTORS, AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS, 52(2), 1998, pp. 57-64
Citations number
19
Categorie Soggetti
Engineering, Eletrical & Electronic",Telecommunications
Journal title
AEU-INTERNATIONAL JOURNAL OF ELECTRONICS AND COMMUNICATIONS
ISSN journal
14348411 → ACNP
Volume
52
Issue
2
Year of publication
1998
Pages
57 - 64
Database
ISI
SICI code
1434-8411(1998)52:2<57:AORAIR>2.0.ZU;2-S
Abstract
A general coupled surface integral equation formulation and a numerica l solution procedure have been employed for the analysis of systems of multiple parallel conductors of general cross sections over a relativ ely wide frequency range. The conductors are excited by a transverse m agnetic (TMz) plane wave. Results for resistance and internal reactanc e for systems of multiple circular and rectangular conductors have bee n obtained, and the proximity effect has also been studied for multico nductor systems by comparing the cases of different spacings between c onductors. The proximity effect causes both the resistance and the int ernal reactance of the outer conductors to increase and causes the res istance and internal reactance of the inner conductors to decrease at moderately high frequencies.