The refractive indices of diluted magnetic semiconductor Cd1-xMnxTe fi
lms on sapphire substrates have been determined by m-line spectroscopy
to precision 0.001 at the wavelengths lambda = 670, 785, and 1150 nm.
Using these data, we designed double-layer. Cd1-xMnxTe structures on
a GaAs substrate, achieving the integration of the magneto-optical wav
eguide on a semiconductor substrate. Good optical confinement of the w
aveguide mode was confirmed. (C) 1997 American Institute of Physics.