CONTAMINATION CAUSED BY ION-EXCHANGE RESIN - CONSEQUENCES FOR ULTRA-TRACE ANALYSIS

Citation
S. Strassburg et al., CONTAMINATION CAUSED BY ION-EXCHANGE RESIN - CONSEQUENCES FOR ULTRA-TRACE ANALYSIS, Fresenius' journal of analytical chemistry, 360(7-8), 1998, pp. 792-794
Citations number
10
Categorie Soggetti
Chemistry Analytical
ISSN journal
09370633
Volume
360
Issue
7-8
Year of publication
1998
Pages
792 - 794
Database
ISI
SICI code
0937-0633(1998)360:7-8<792:CCBIR->2.0.ZU;2-I
Abstract
Well known sources of contamination are the laboratory environment, ve ssels, reagents and handling of the sample. Attention is drawn to the importance of cationic impurities included in the ion-exchangers used for trace-matrix separations (TMS) at the sub-ng/g-level. The usual ri nsing and conditioning of the resins does not remove all adhering meta ls and thus leads to contaminated eluates in analytical work. High and badly reproducible blanks are observed, in particular for Na, Mg, Al, K, Cr, Fe, Zn and Ba. They are introduced during the polymerization p rocess and are not ionically bound but obviously included in the polym er matrix. Any time when another ''nest'' of inclusion is opened in th e resin column by mechanical stress, the next irreproducible event of contamination occurs.