The appearance of Tech Pan film in sizes that were useful in large Sch
midt telescopes immediately offered new opportunities and advantages t
o users of Schmidt telescopes. Among the advantages were a spatial res
olution that was well matched to the image quality produced by the opt
ics of the telescope under the best conditions. For the first time suc
h images were well sampled on Schmidt telescopes. Tech Pan was initial
ly formulated by Eastman Kodak as a 35 mm solar patrol film designed t
o have enhanced sensitivity around the 656.2 nm H alpha line. It is th
is feature, combined with the excellent imaging characteristics, that
we seek to exploit with the new UK Schmidt Telescope (UKST) H alpha su
rvey. This paper briefly reports some preliminary comparative tests of
Tech Pan with the new H alpha filter at UKST and suggests ways in whi
ch data from the new survey can be quickly exploited using advanced ph
otographic techniques such as photographic amplification. This simple
contact copying process rapidly reveals extended low surface brightnes
s features that simple inspection cannot.