ELASTIC PROPERTY CHARACTERIZATION IN THIN SAMPLES OF SUBWAVELENGTH INTHICKNESS

Authors
CAO WW
Citation
Ww. Cao, ELASTIC PROPERTY CHARACTERIZATION IN THIN SAMPLES OF SUBWAVELENGTH INTHICKNESS, Ferroelectrics, 206(1-4), 1998, pp. 355-363
Citations number
6
Categorie Soggetti
Physics, Condensed Matter","Material Science
Journal title
Ferroelectrics → ACNP
ISSN journal
00150193
Volume
206
Issue
1-4
Year of publication
1998
Pages
355 - 363
Database
ISI
SICI code
0015-0193(1998)206:1-4<355:EPCITS>2.0.ZU;2-N
Abstract
A conflict exists in ultrasonic measurements between the resolution wh ich requires higher frequency, and the penetration depth which require s long wavelength. Traditional pulse-echo method for elastic property measurements fails when the sample becomes too thin to allow the separ ation of repeated echoes. A data processing technique is described her e which may provide a solution to this conflict. Elastic properties we re successfully measured in samples as thin as 5% of the wavelength la mbda.