STRUCTURE CONTROL OF PULSED-LASER-DEPOSITED PB0.6SR0.4TIO3 LA0.5SR0.5COO3 THIN-FILMS ON VARIOUS SUBSTRATES/

Structure development is an important issue for the growth of ferroele ctric thin film. In the present experiment, Pb0.6Sr0.4TiO3(PSrT)/La0.5 Sr0.5CoO3 (LSCO) thin films have been grown on various substrates, suc h as: single crystal Si with (100) and (111) orientations, Au/Si, Pt/S i and glass, using XeCl excimer laser (wavelength = 308 nm) under vari ous processing conditions. X-ray diffraction results show that highly (100)-oriented LSCO films can be deposited successfully under appropri ate processing conditions regardless the type of the substrate. PSrT f ilms can be deposited upon LSCO layer with the same structure arrangem ents if LSCO can develop desired structures. It appears that appropria te processing parameters are more important than lattice parameter con sideration for growing LSCO films using pulsed laser deposition. Micro structure investigations indicate that the substrate with an amorphous surface layer may help the development of the desired structure.