GRAPHIC ANALYSIS OF THE EFFECTIVE REFLECTIVITY OF ANTIREFLECTION-COATED FILMS ON DIODE FACETS

Citation
Xh. Zhou et al., GRAPHIC ANALYSIS OF THE EFFECTIVE REFLECTIVITY OF ANTIREFLECTION-COATED FILMS ON DIODE FACETS, Applied optics, 37(12), 1998, pp. 2385-2389
Citations number
6
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
37
Issue
12
Year of publication
1998
Pages
2385 - 2389
Database
ISI
SICI code
0003-6935(1998)37:12<2385:GAOTER>2.0.ZU;2-9
Abstract
The wavelength dependence of the reflectivity of AR-coated facets and carrier density in relation to peak wavelength of the gain profile hav e been taken into consideration to study a one-Beet AR-coated semicond uctor diode laser. A graphic analysis method is developed to study cas es in which analytical expressions of the reflectivity curves cannot b e extracted. Results show that the upper bound of the carrier density that can he established inside the diode is generally (sometimes to a considerable degree) smaller than that determined by the claimed minim um reflectivity if the spectral width of the reflectivity curve cannot be regarded as infinite. This implies that the effective reflectivity of the AR-coated facet is generally larger than the claimed minimum r eflectivity. To increase the effectiveness of AR film, it is essential to maintain tight control of the wavelength at which the reflectivity curve is minimum. (C) 1998 Optical Society of America.