MUELLER MATRICES AND INFORMATION DERIVED FROM LINEAR-POLARIZATION LIDAR MEASUREMENTS - THEORY

Authors
Citation
A. Bendavid, MUELLER MATRICES AND INFORMATION DERIVED FROM LINEAR-POLARIZATION LIDAR MEASUREMENTS - THEORY, Applied optics, 37(12), 1998, pp. 2448-2463
Citations number
13
Categorie Soggetti
Optics
Journal title
ISSN journal
00036935
Volume
37
Issue
12
Year of publication
1998
Pages
2448 - 2463
Database
ISI
SICI code
0003-6935(1998)37:12<2448:MMAIDF>2.0.ZU;2-M
Abstract
Mueller matrix (M) over tilde is developed for a single-scattering pro cess such that G(theta,phi) = (T) over tilde(phi(a)) (M) over tilde (T ) over tilde(phi(p))u, where u is the incident irradiance Stakes vecto r transmitted through a linear polarizer at azimuthal angle phi(p), wi th transmission Mueller matrix (T) over tilde(phi(p)), and G(theta, ph i) is the polarized irradiance Stokes rector measured by a detector wi th a field of view F, placed after an analyzer with transmission Muell er matrix (T) over tilde(phi(a)) at angle phi(a). The Mueller matrix ( M) over tilde is a function of the Mueller matrix (S) over tilde(theta ) of the scattering medium, the scattering angle (theta, phi), and the detector field of view F. The Mueller matrix (M) over tilde is derive d for backscattering and forward scattering, along with equations for the detector polarized irradiance measurements (e.g., cross polarizati on and copolarization) and the depolarization ratio. The information t hat can be derived from the. Mueller matrix (M) over tilde on the scat tering Mueller matrix (S) over tilde(theta) is limited because the det ector integrates the cone of incoming radiance over a range of azimuth s of 2 pi for forward scattering and backscattering. However, all nine Mueller matrix elements that affect linearly polarized radiation can be derived if a spatial filter in the form of a pie-slice slit is plac ed in the focal plane of the detector and azimuthally dependent polari zed measurements and azimuthally integrated polarized measurements are combined, (C) 1998 Optical Society of America.