STUDY OF THE GROWTH MECHANISMS OF CHROMIUM NITRIDE FILMS DEPOSITED BYVACUUM-ARC EVAPORATION

Citation
C. Gautier et J. Machet, STUDY OF THE GROWTH MECHANISMS OF CHROMIUM NITRIDE FILMS DEPOSITED BYVACUUM-ARC EVAPORATION, Thin solid films, 295(1-2), 1997, pp. 43-52
Citations number
35
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
295
Issue
1-2
Year of publication
1997
Pages
43 - 52
Database
ISI
SICI code
0040-6090(1997)295:1-2<43:SOTGMO>2.0.ZU;2-0
Abstract
Chromium nitride films have been deposited using the vacuum are evapor ation technique. The influence of the main deposition parameters (nitr ogen pressure p(N2), substrate temperature T-s, substrate bias voltage V-s and argon partial pressure p(Ar)) on the structural and mechanica l properties of the coatings has been investigated. It has been found that the nitrogen pressure determines the phase composition in the lay ers, while T-s, V-s and p(Ar) have more direct effects on the texture of the films. The mechanical properties which depend on the compositio n but also on the structure and the morphology of the coatings, exhibi t a strong dependence on all the deposition parameters. (C) 1997 Elsev ier Science S.A.