IN-SITU X-RAY-INVESTIGATION OF HYDROGEN CHARGING IN THIN-FILM BIMETALLIC ELECTRODES (VOL 8, PG 2091, 1997)

Authors
JISRAWI NM WIESMANN H RUCKMAN MW THURSTON TR REISFELD G OCKO BM STRONGIN M
Citation
Nm. Jisrawi et al., IN-SITU X-RAY-INVESTIGATION OF HYDROGEN CHARGING IN THIN-FILM BIMETALLIC ELECTRODES (VOL 8, PG 2091, 1997), Journal of materials research, 13(2), 1998, pp. 518-518
Citations number
1
Categorie Soggetti
Material Science
Journal title
Journal of materials research → ACNP
ISSN journal
08842914
Volume
13
Issue
2
Year of publication
1998
Pages
518 - 518
Database
ISI
SICI code
0884-2914(1998)13:2<518:IXOHCI>2.0.ZU;2-Q