A REFLECTION-MODE APERTURELESS SCANNING NEAR-FIELD OPTICAL MICROSCOPEDEVELOPED FROM A COMMERCIAL SCANNING PROBE MICROSCOPE

We have developed a polyvalent reflection-mode apertureless scanning n ear-field optical microscope (SNOM) from a commercial scanning probe m icroscope (SPM). After having explained our motivations, we describe t he instrument precisely, by specifying how we have integrated optical elements to the initial SPM, by taking advantage of its characteristic s, and without modifying its initial functions. The instrument allows five different reflection-mode SNOM configurations and enables polariz ation studies. Three types of SNOM probes can be used: dielectric, sem iconducting, and metallic probes. The latter an homemade probes whose successful use, as probes for atomic force microscopy, by the commerci al SPM has been experimentally demonstrated. Using silicon-nitride (di electric) probes, one of the five configurations has been experimental ly tested with two samples. The first sample is made of nanometric alu minum dots on a glass substrate and the second sample is the output fr ont facet of a laser diode. The preliminary SNOM images of the latter reveal pure optical contrasts. (C) 1998 American Institute of Physics. [S0034-6748(98)03404-2].