J. Salvi et al., PIEZOELECTRIC SHEAR FORCE DETECTION - A GEOMETRY AVOIDING CRITICAL TIP TUNING FORK GLUING, Review of scientific instruments, 69(4), 1998, pp. 1744-1746
A technique for controlling the tip-sample distance in near-field opti
cal microscopes is presented. It consists of mechanically exciting a f
iber tip inserted without any adhesive between the two prongs of a hig
h Q-piezoelectric tuning fork. The detection of the shear forces is cl
assically achieved by measuring the decrease of the dithering amplitud
e when the tip approaches the surface. This simple setup greatly simpl
ifies tip replacement and its resonance frequency tuning. (C) 1998 Ame
rican Institute of Physics. [S0034-6748(98)01604-9].