A new quenching technique was used for detailed microstructural examin
ation of quenched YBa2Cu3O6+delta/liquid interfaces. The examination r
evealed that the growth rate and the amount of excess Y2BaCuO5 (211) h
ad a strong influence on the growth morphology of YBa2Cu3O6+delta (123
). The maximum growth rate at which single crystal growth could be obt
ained increased from 1 mu m/s to 1.5 mu m/s as excess 211 content incr
eased from 0 to 30 wt. %. It then decreased to 1 mu m/s as excess 211
increased to 40 wt. %. Dendritic growth with distinguishable secondary
arms occurred for stoichiometric 123 samples in the regime of cellula
r/dendritic growth. A highly curved 123 envelope was formed on 211 par
ticles located at the 123 growth interface for stoichiometric 123 samp
les in the regime of single crystal growth. The microscopic 123 growth
interface became flat as excess 211 content increased to 20 wt, %. Th
e engulfment of 211 particles into 123 matrix is discussed based on de
tailed microstructural examination. It is found that the formation of
a small highly curved 123 envelope on 211 particles for stoichiometric
123 samples is due to the large 211 particle spacing.