SPINNING DEPOSITION OF SILICA AND SILICA-TITANIA OPTICAL COATINGS - AROUND-ROBIN TEST

Citation
M. Guglielmi et al., SPINNING DEPOSITION OF SILICA AND SILICA-TITANIA OPTICAL COATINGS - AROUND-ROBIN TEST, Journal of materials research, 13(3), 1998, pp. 731-738
Citations number
18
Categorie Soggetti
Material Science
ISSN journal
08842914
Volume
13
Issue
3
Year of publication
1998
Pages
731 - 738
Database
ISI
SICI code
0884-2914(1998)13:3<731:SDOSAS>2.0.ZU;2-D
Abstract
A round robin test has been performed on sol-gel processing for the de position of silica and silica-titania films on silicon substrates by s pin-coating. Three solution preparation processes for silica coatings and three for silica-titania coatings were used to prepare samples at each of the participating laboratories. The films have been characteri zed mainly by thickness (profilometry and ellipsometry measurements), refractive index, porosity, and optical scattering. Different processe s gave different thicknesses. Thickness differences were found in film s prepared by the same process and by the same deposition parameters, but in different laboratories, when heat-treated at 500 degrees C. Var iations were reduced in samples annealed at 1000 degrees C. Refractive index and porosity measurements suggest that variations were due to s tructural differences, particularly porosity. Furthermore, films heat- treated at 500 degrees C were not completely stabilized, and showed in dex and porosity variations after six months.