M. Guglielmi et al., SPINNING DEPOSITION OF SILICA AND SILICA-TITANIA OPTICAL COATINGS - AROUND-ROBIN TEST, Journal of materials research, 13(3), 1998, pp. 731-738
A round robin test has been performed on sol-gel processing for the de
position of silica and silica-titania films on silicon substrates by s
pin-coating. Three solution preparation processes for silica coatings
and three for silica-titania coatings were used to prepare samples at
each of the participating laboratories. The films have been characteri
zed mainly by thickness (profilometry and ellipsometry measurements),
refractive index, porosity, and optical scattering. Different processe
s gave different thicknesses. Thickness differences were found in film
s prepared by the same process and by the same deposition parameters,
but in different laboratories, when heat-treated at 500 degrees C. Var
iations were reduced in samples annealed at 1000 degrees C. Refractive
index and porosity measurements suggest that variations were due to s
tructural differences, particularly porosity. Furthermore, films heat-
treated at 500 degrees C were not completely stabilized, and showed in
dex and porosity variations after six months.