SINGLE-BEAM POLARIZATION INTERFEROMETRY MEASUREMENT OF THE LINEAR ELECTROOPTIC EFFECT IN POLED POLYMER-FILMS WITH A REFLECTION CONFIGURATION

Authors
Citation
Sh. Han et Jw. Wu, SINGLE-BEAM POLARIZATION INTERFEROMETRY MEASUREMENT OF THE LINEAR ELECTROOPTIC EFFECT IN POLED POLYMER-FILMS WITH A REFLECTION CONFIGURATION, Journal of the Optical Society of America. B, Optical physics, 14(5), 1997, pp. 1131-1137
Citations number
15
Categorie Soggetti
Optics
ISSN journal
07403224
Volume
14
Issue
5
Year of publication
1997
Pages
1131 - 1137
Database
ISI
SICI code
0740-3224(1997)14:5<1131:SPIMOT>2.0.ZU;2-5
Abstract
Measurement of the linear electro-optic effect in poled polymer thin f ilms with two parallel electrodes is analyzed. A single-beam polarizat ion interferometry is adopted in a reflection configuration. The depen dence of the linear electro-optic modulated intensity on linear optica l parameters is investigated experimentally and is compared with the t heoretical analysis. Specifically, the electro-optic modulated intensi ty is measured as a function of optical bias, optical polarization dir ection, and incidence angle. In particular, the dependence of the elec tro-optic modulated signal on the incidence angle shows that the linea r electro-optic effect in the polymer thin film induces the modulation s of both the refractive angle and the linear refractive index. Also, the amount of Fabry-Perot effect influencing the modulation signal is analyzed. (C) 1997 Optical Society of America.