R. Lucklum et al., ERROR ANALYSIS OF MATERIAL PARAMETER DETERMINATION WITH QUARTZ-CRYSTAL RESONATORS, Sensors and actuators. A, Physical, 66(1-3), 1998, pp. 184-192
The application of quartz-crystal resonators for materials science is
based on the dependence of acoustic-wave propagation on the film shear
modulus and density. In contrast to the well-known chemical-sensor ap
plications, the shear modulus determination of a thin film needs a com
plete electrical impedance (or admittance) analysis and a complex fitt
ing procedure of the measured responses. This contribution concentrate
s on different error sources in the procedure to deter-mine shear para
meters. (C) 1998 Elsevier Science S.A. All rights reserved.