BAND DISPERSIONS IN PHOTOLUMINESCENT POROUS SI

The same band dispersions as those obtained from crystalline Si along the Gamma Delta-X symmetry line are first observed from photoluminesce nt porous Si independent of its microstructure and porosity using an a ngle-resolved photoemission technique. The electronic structures of po rous Si observed in the normal photoemission, valence photoemission, a nd L-edge x-ray absorption spectra are interpreted consistently to res ult from the overlap of that of bulk crystalline Si and that relating to the receding valence structure, which is suggested experimentally t o be linked to the luminescence origin.