NONLINEAR REFLECTIVITY OF SEMICONDUCTOR MICROCAVITIES IN THE WEAK-COUPLING AND STRONG-COUPLING REGIMES - EXPERIMENT AND THEORY

We use an entirely classical model to describe the nonlinear propertie s of semiconductor microcavities in both the weak-and strong-coupling regimes, as measured in a series of spectrally and temporally resolved pump-probe experiments. The model, which follows on from a linear dis persion model previously used to describe the linear properties, provi des very good qualitative agreement between a wide range of experiment al and theoretical spectra. We also find that on the time scales of ou r observation (tens of picoseconds), the model provides an excellent d escription of the complex temporal evolution of the nonlinear spectra. [S0163-1829(98)05816-0].