Wra. Huff et al., ANGLE-RESOLVED PHOTOELECTRON-SPECTROSCOPY STUDY OF THE INP(100)-(2X4)SURFACE ELECTRONIC-STRUCTURE, Physical review. B, Condensed matter, 57(16), 1998, pp. 10132-10137
The InP(100)-(2 x 4) surface electronic structure was studied using an
gle-resolved photoelectron spectroscopy together with synchrotron radi
ation. We identify three surface states occurring in the gaps of the p
rojected bulk bands. The highest level state, located at binding energ
y E-B = 1.0 eV, is consistent with previous findings. The second and t
hird states, located at E-B = 1.8 and 4.3 eV, have not been reported p
reviously. All three of these surface states show no discernible dispe
rsion as compared to the surface states on InAs(100)-(2x4) and GaAs(10
0)-(2x4). This result suggests that the elements of the InP(100)-(2x4)
surface unit cells are more isolated from each other than they are fo
r the InAs(100)-(2x4) or the GaAs(100)-(2x4) surface.