INTERFACE FORMATION BETWEEN ULTRATHIN FILMS OF TITANIUM AND (0001)SAPPHIRE SUBSTRATES

Citation
S. Bernath et al., INTERFACE FORMATION BETWEEN ULTRATHIN FILMS OF TITANIUM AND (0001)SAPPHIRE SUBSTRATES, Surface science, 400(1-3), 1998, pp. 335-344
Citations number
25
Categorie Soggetti
Chemistry Physical
Journal title
ISSN journal
00396028
Volume
400
Issue
1-3
Year of publication
1998
Pages
335 - 344
Database
ISI
SICI code
0039-6028(1998)400:1-3<335:IFBUFO>2.0.ZU;2-U
Abstract
The growth of ultrathin films of titanium (less than or equal to 2 mon olayers) on the (0001) plane of sapphire at room temperature was inves tigated by in-situ Auger electron spectroscopy. Quantification of expe rimental measurements showed that the interface between titanium and s apphire was composed of a suboxide of titanium and partially reduced a luminium oxide. interface formation starred with the appearance of a T i2O3-type phase, which led to pure titanium with increasing film thick ness. (C) 1998 Elsevier Science B.V.