STUDY ON SURFACE MAGNETIC DOMAIN-STRUCTURE OF THIN-GAUGED 3-PERCENT-SI-FE STRIPS USING SCANNING ELECTRON-MICROSCOPE WITH POLARIZATION ANALYZER

Authors
LEE Y KOYMEN AR HEO NH NA JG WOO JS
Citation
Y. Lee et al., STUDY ON SURFACE MAGNETIC DOMAIN-STRUCTURE OF THIN-GAUGED 3-PERCENT-SI-FE STRIPS USING SCANNING ELECTRON-MICROSCOPE WITH POLARIZATION ANALYZER, Scripta materialia, 38(9), 1998, pp. 1365-1369
Citations number
6
Categorie Soggetti
Material Science","Metallurgy & Metallurigical Engineering
Journal title
Scripta materialia → ACNP
ISSN journal
13596462
Volume
38
Issue
9
Year of publication
1998
Pages
1365 - 1369
Database
ISI
SICI code
1359-6462(1998)38:9<1365:SOSMDO>2.0.ZU;2-1