Second-harmonic generation (SHG) has been applied to study the influen
ce of defects in short-period (SimGen)(p) strained-layer superlattices
. With a misfit stacking fault defect density of similar to 10(10) cm(
-2) shown by transmission electron microscopy, it is found that the SH
intensity increases by about one order of magnitude from that of the
defect-for samples. We propose that the inhomogeneous strain field aro
und the fault planes in the superlattice layers is responsible for thi
s abrupt increase of SHG. The expected symmetry and the magnitude of t
he nonlinear susceptibility from these stacking fault defects are show
n to be in agreement with the experimental observations. (C) 1998 Amer
ican Institute of Physics.