X-RAY-ABSORPTION SPECTROSCOPY AND ATOMIC-FORCE MICROSCOPY STUDY OF BIAS-ENHANCED NUCLEATION OF DIAMOND FILMS

The bias-enhanced nucleation of diamond on Si(100) has been studied by x-ray absorption near-edge spectroscopy (XANES) and atomic force micr oscopy, two techniques well suited to characterize nanometric crystall ites. Diamond nuclei of similar to 15 nm are formed after 5 min of bia s-enhanced treatment. The number of nuclei and its size increases with the time of application of the bias voltage. A nanocrystalline diamon d film is attained after 20 min of bias-enhanced nucleation. At the in itial nucleation stages, the Si substrate appears covered with diamond crystallites and graphite, without SiC being detected by XANES. (C) 1 998 American Institute of Physics.