ANGULAR-DEPENDENCE OF THE REFLECTANCE AND TRANSMITTANCE OF CDS FILMS FORMED BY LASER-ABLATION

The dependence of reflectance and transmittance on the angle of incide nce and the polarization of visible light was measured for thin(approx imate to 2 mu m) CdS films formed by laser ablation. The experiments w ere carried out at 300 K with argon and He-Ne lasers. In the blue and green spectral ranges, the experiments were described straightforwardl y by the theoretical approach for highly absorptive materials, omittin g the film thickness. For red light, the sample represents dielectric material and multiple reflections must be considered to fit the experi ments. Furthermore, it is shown that the angular-dependent features of red light are an accurate tool to determine the film thickness. (C) 1 998 American Institute of Physics.