To build three-dimensional micro-opto-electro-mechanical systems (MOEM
S), new materials have to be designed. However, increased manufacturab
ility results generally in modified/degraded optical, mechanical, and
electrical characteristics. The paper presents a detailed analysis of
p + silicon as an opto-electro-mechanical material for microresonators
, and gives some hints on the problems associated with the use of low-
temperature dielectric in electrostatic microactuators. All the releva
nt parameters of p + silicon are experimentally determined and process
recommendations allowing improved quality are formulated. Charge inje
ction and trapping in low-temperature dielectric are analyzed and thei
r impact on the behavior of the electrostatic actuators evaluated. (C)
1997 Society of Photo-Optical Instrumentation Engineers.