Pm. Hoffmann et al., ANALYSIS OF THE IMPEDANCE RESPONSE DUE TO SURFACE-STATES AT THE SEMICONDUCTOR SOLUTION INTERFACE/, Journal of applied physics, 83(8), 1998, pp. 4309-4323
Electronic surface states at semiconductor/solution interfaces can med
iate processes such as trapping and detrapping of majority and minorit
y charge carriers, recombination, or charge transfer to or from the so
lution. We have calculated the complete impedance response due to thes
e processes using a kinetic approach. Specific cases are discussed and
diagnostic parameters for the capacitance and conductance are present
ed. Experimental results on n-Si(111) in fluoride solutions are used t
o illustrate the obtained expressions. (C) 1998 American Institute of
Physics.