Some possibilities for binary 2-D fractal image characterization using
correlation analysis of the transmitted light intensity fluctuations
are discussed. These intensity fluctuations are produced by the probe
coherent beam scanning of the studied object. Two different cases of d
iagnostics of the mass fractal structures are considered: with a broad
collimated illuminating beam and with a sharply focused beam. Relatio
nships between generalized characteristics of the studied structures (
e.g., Hausdorff dimension) and asymptotic parameters of the structure
functions of the intensity fluctuations (e.g., their exponents) are an
alyzed. Experimental results obtained with the specially prepared 2-D
mass fractal structures (binary amplitude screens) are presented. Poss
ible applications for morphological analysis of tissue structures are
discussed. (C) 1997 Society of Photo-Optical Instrumentation Engineers
.