XRF INTERMEDIATE THICKNESS LAYER TECHNIQUE FOR ANALYSIS OF RESIDUE OFHARD TO DISSOLVE MATERIALS

This work presents a quick method for lead and Silver determination in materials, such as slags from silver metallurgy and slimes from coppe r electrorefining, which are very difficult to dissolve, even using a microwave technique. The idea was to dissolve the possibly greatest am ount of a sample using acids. Insoluble deposit was filtered out. Silv er content in the solution was analysed by potentiometric titration or AAS, lead content by the XRF, whilst sediment deposited on filter - b y XRF intermediate thickness technique. The results of silver and lead analysis obtained by this method were compared with those obtained by classical method, i.e. melting the residue with sodium peroxide.