Jm. Chalmers et al., FOURIER-TRANSFORM INFRARED MICROSCOPY - SOME ADVANCES IN TECHNIQUES FOR CHARACTERIZATION AND STRUCTURE-PROPERTY ELUCIDATIONS OF INDUSTRIAL MATERIAL, Analyst, 123(4), 1998, pp. 579-586
FTIR-microscopy has become one of the foremost vibrational spectroscop
y techniques for problem-solving and analysing and mapping the chemica
l structure and physical characteristics associated with industrial ma
terials and their fabricated products. Many recent advances have utili
sed the attributes of reflection techniques, such as specular reflecti
on spectroscopy approaches, while emerging capabilities becoming avail
able to the industrial spectroscopist include both spectral imaging an
d use of synchrotron radiation as a source. This paper seeks to illust
rate each of these recent advances and developments through applicatio
ns of FTIR-microscopy to industrial problem-solving case studies.