PROBING OF DYNAMIC CHARGE STATES USING SI NGLE-ELECTRON TUNNELING TRANSISTORS

Authors
KRUPENIN VA LOTKHOV SV SCHERER H ZORIN AB AHLERS FJ NIEMEYER J WOLF H
Citation
Va. Krupenin et al., PROBING OF DYNAMIC CHARGE STATES USING SI NGLE-ELECTRON TUNNELING TRANSISTORS, Uspehi fiziceskih nauk, 168(2), 1998, pp. 219-222
Citations number
7
Categorie Soggetti
Physics
Journal title
Uspehi fiziceskih nauk → ACNP
ISSN journal
00421294
Volume
168
Issue
2
Year of publication
1998
Pages
219 - 222
Database
ISI
SICI code
0042-1294(1998)168:2<219:PODCSU>2.0.ZU;2-4