SOFT-LANDED IONS - A ROUTE TO IONIC SOLUTION STUDIES

Authors
TSEKOURAS AA IEDEMA MJ ELLISON GB COWIN JP
Citation
Aa. Tsekouras et al., SOFT-LANDED IONS - A ROUTE TO IONIC SOLUTION STUDIES, International journal of mass spectrometry and ion processes, 174(1-3), 1998, pp. 219-230
Citations number
18
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
Journal title
International journal of mass spectrometry and ion processes → ACNP
ISSN journal
01681176
Volume
174
Issue
1-3
Year of publication
1998
Pages
219 - 230
Database
ISI
SICI code
0168-1176(1998)174:1-3<219:SI-ART>2.0.ZU;2-V
Abstract
Solvated ions in condensed phase can be studied with new directness, u sing a very low energy(less than or equal to 1 eV) mass-selected ion s ource, to 'soft-land' ions on or within surface films. The very low en ergy allows almost any ion to be studied without impact damage. Result s for hydronium ions deposited on water ice are presented, where the l ack of hydronium diffusion up to 190 K is evident, and intriguing info rmation on dielectric behavior is measured. Cs+ ions moving in n-hexan e and 3-methyl pentane are also discussed. (C) 1998 Elsevier Science B .V.