H. Muller et V. Kempter, SURFACE-INDUCED DISSOCIATION IN H-2(-SPECTROSCOPY() COLLISIONS STUDIED WITH ION IMPACT ELECTRON), International journal of mass spectrometry and ion processes, 174(1-3), 1998, pp. 285-296
Citations number
36
Categorie Soggetti
Spectroscopy,"Physics, Atomic, Molecular & Chemical
The electronic transition processes in slow collisions of small molecu
lar ions with metal surfaces are discussed briefly. Examples will be g
iven where molecular dissociation is induced by electronic transitions
between the projectile and the surface. It will be demonstrated how i
nformation on surface-induced dissociation (SID) can be obtained from
ion impact electron spectroscopy. For slow collisions (mostly 50 eV) o
f H-2(+) with tungsten surfaces the following channels for SID can be
identified from the analysis of the ion impact electron spectra: (1) o
n clean tungsten, the neutralization of the projectile ions into the r
epulsive state H-2(b(3) Sigma(u)(+)), both resonantly and by Auger cap
ture; and (2) for alkali covered tungsten, in addition to direct H-2(b
(3) Sigma(u)(+)) population, both Auger de-excitation to H-2(b(3) Sigm
a(u)(+)) and mechanical dissociation of hydrogen states, correlating w
ith H(n = 2) + H(1s). (C) 1998 Elsevier Science B.V.