FASTSCAN Z-SCAN SYSTEM FOR DETERMINING OPTICAL NONLINEARITIES IN SEMICONDUCTORS

Traditional z-scan techniques have been used to determine the non-line ar optical coefficients of semiconductors. This is usually carried out by scanning a sample along the optical z-axis using a manual or compu ter-controlled linear translation stage. We report upon a novel z-scan method involving a fastscanning sample-holder: This gives real-time z -scan traces and greatly improves experimental efficiency and applicab ility. The technique is used here to study the two-photon absorption c oefficient of ZnSe, (C) 1998 Elsevier Science Ltd. All rights reserved .