Rs. Sirohi et Nk. Mohan, AN INPLANE INSENSITIVE MULTIAPERTURE SPECKLE SHEAR INTERFEROMETER FORSLOPE MEASUREMENT, Optics and Laser Technology, 29(7), 1997, pp. 415-417
A modified two-aperture speckle shear interferometer that eliminates t
he contribution of the in-plane component and its derivative to the ph
ase change, and yields a fringe pattern corresponding to the first-ord
er partial derivatives of the out-of-plane displacement component, is
reported in this note. In this method, two laterally sheared object po
ints are viewed axially. The wave fields from these points ave indepen
dently combined at the image plane of the imaging system. (C) 1998 Els
evier Science Ltd. All rights reserved.